Microstructure and magnetic properties of Fe/Ti multilayers

Journal of Physics Condensed Matter

Volumn 9, Issue 1, 1997, Pages 103-115

  Kopcewicz, M ^a   Stobiecki, T ^a   Czapkiewicz, M ^b   Grabias, A ^a  

^a Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

^b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; ELECTRIC CONDUCTIVITY MEASUREMENT; GRAIN BOUNDARIES; IRON ALLOYS; MAGNETIC PROPERTIES; METALLIC FILMS; MOSSBAUER SPECTROSCOPY; SPUTTER DEPOSITION; TITANIUM; X RAY DIFFRACTION;

COERCIVE FIELD MEASUREMENT; CONVERSION ELECTRON MOSSBAUER SPECTROSCOPY; CRYSTALLINE SUBLAYERS;

MULTILAYERS;

EID: 0031555553     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/9/1/012     Document Type: Article

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