Microscopic chemical state identification of a silicon-carbide fiber by soft x-ray photoabsorption spectroscopy

Applied Physics Letters

Volumn 70, Issue 18, 1997, Pages 2389-2391

  Ma, Qing ^a   Rosenberg, Richard A ^a   Kim, Changyoung ^b   Grepstad, Jostein ^b   Pianetta, Piero ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; ELECTRON ENERGY LEVELS; ELECTRON RESONANCE; FIBERS; MICROSCOPES; MICROSCOPIC EXAMINATION; PHOTONS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL STATES; MAGNETIC PROJECTION PHOTOELECTRON MICROSCOPE; SOFT X RAY PHOTOABSORPTION SPECTROSCOPY;

SILICON CARBIDE;

EID: 0031554241     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118881     Document Type: Article

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