Quantitative analysis of electron microscopic micrographs of multilayers

Thin Solid Films

Volumn 292, Issue 1-2, 1997, Pages 118-123

  Schuhrke, T ^a   Zweck, J ^a   Hoffmann, H ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

Interfaces; Multilayers; Superlattices; Transmission electron microscope

Indexed keywords

COBALT ALLOYS; CORRELATION METHODS; DIGITAL SIGNAL PROCESSING; ELECTRON MICROSCOPES; IMAGE PROCESSING; INTERFACES (MATERIALS); IRON ALLOYS; PLATINUM COMPOUNDS; SUPERLATTICES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

COBALT COPPER ALLOYS; CROSS CORRELATION METHOD; DIGITAL IMAGE PROCESSING; IRON GOLD ALLOYS; MICROGRAPHS; PLATINUM ALUMINA;

MULTILAYERS;

EID: 0031553503     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08976-6     Document Type: Article

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