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Volumn 292, Issue 1-2, 1997, Pages 75-84

Deposition process study of chromium oxide thin films obtained by d.c. Magnetron sputtering

Author keywords

Deposition process; Oxides; Physical vapour deposition; Sputtering

Indexed keywords

ATOMS; CALCULATIONS; CHROMIUM COMPOUNDS; COATINGS; CRYSTALLIZATION; DEPOSITION; HYSTERESIS; MAGNETRON SPUTTERING; OXYGEN; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031553494     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08941-9     Document Type: Article
Times cited : (47)

References (6)
  • 2
    • 0000443370 scopus 로고
    • A.S. Kao, J. Appl. Phys., 66 (11) (1989) 5315-5321.
    • (1989) J. Appl. Phys. , vol.66 , Issue.11 , pp. 5315-5321
    • Kao, A.S.1
  • 4
    • 0003459529 scopus 로고
    • Perkin-Elmer Corporation, Physical Electronics Division, Oct
    • Handbook of X-Ray PhotoElectron Spectroscopy, Perkin-Elmer Corporation, Physical Electronics Division, Oct 1992, pp. 44-45, 76-77.
    • (1992) Handbook of X-ray Photoelectron Spectroscopy , pp. 44-45
  • 6
    • 0039117994 scopus 로고
    • 4th int. Symp. On trends and new applications in thin films - TATF'94 Dresden, Germany
    • G. Hecht, F. Richter and J. Hahn (eds.), DGM Informationsgesellschaft, Oberursel
    • K. Ellmer, in G. Hecht, F. Richter and J. Hahn (eds.), 4th Int. Symp. on Trends and New Applications in Thin Films - TATF'94 Dresden, Germany, Proceedings in Thin Films, DGM Informationsgesellschaft, Oberursel, 1994, pp. 131-134.
    • (1994) Proceedings in Thin Films , pp. 131-134
    • Ellmer, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.