Characterization of the Ni(II) phase formed on silica upon deposition-precipitation

Journal of Physical Chemistry B

Volumn 101, Issue 36, 1997, Pages 7060-7074

  Burattin, Paolo ^a,b   Che, Michel ^a,c   Louis, Catherine ^a  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^b SANOFI   (France)

^c INSTITUT UNIVERSITAIRE DE FRANCE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CATALYST SUPPORTS; CRYSTALLIZATION; DEPOSITION; INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); PRECIPITATION (CHEMICAL); REDUCTION; SILICA; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; NICKEL HYDROXIDE; NICKEL PHYLLOSILICATE; TEMPERATURE PROGRAMMED REDUCTION (TPR);

NICKEL;

EID: 0031552944     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp970194d     Document Type: Article

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