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Volumn 13, Issue 18, 1997, Pages 4795-4798

High-resolution atomic force microscopy of dextran monolayer hydration

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEHYDRATION; ELASTICITY; HYDRATION; MONOLAYERS; MORPHOLOGY; SURFACE PROPERTIES; SURFACE STRUCTURE; SWELLING;

EID: 0031551388     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970288e     Document Type: Article
Times cited : (15)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.