Scanning Auger measurements of activated and sputter cleaned re-coated scandate cathodes

Applied Surface Science

Volumn 111, Issue , 1997, Pages 24-29

  Van Slooten, Udo ^a   Duine, Peter A ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Electron emission; Sc supply rate; Scandate cathodes; Surface roughness

Indexed keywords

CURRENT DENSITY; ELECTRON EMISSION; ION BOMBARDMENT; RHENIUM PLATING; SPUTTER DEPOSITION; SURFACE ROUGHNESS;

SCANDATE CATHODES; SCANNING AUGER MEASUREMENTS (SAM);

THERMIONIC CATHODES;

EID: 0031550418     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00716-7     Document Type: Article

References (3)

1. G. Gaertner et al., This proceedings, invited paper E1.
2. S. Yamamoto, S. Taguchi, T. Aida and S. Kawase, Appl. Surf. Sci. 17 (1984) 504.
3. A. Manenschijn, J.A.J.M. Deckers, Th.H. Weekers and P.A.M. van der Heide, Conf. Record of the Tri-serivice/NASA Cathode Workshop, Greenbelt, MD, 1992, p. 67.