Structural basis of low-frequency excitations in silicophosphate glasses

Journal of Non-Crystalline Solids

Volumn 222, Issue , 1997, Pages 321-328

  Kanert, O ^a   Kuechler, R ^a   Peters, J ^a   Volmari, A ^a   Jain, H ^a   Eckert, H ^a   Ratai, E ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; ELECTRIC CONDUCTIVITY MEASUREMENT; LITHIUM; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; SILICON COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

ASYMMETRIC DOUBLE WELL POTENTIAL (ADWP); SILICOPHOSPHATE GLASSES;

GLASS;

EID: 0031549984     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(97)00377-3     Document Type: Article

References (14)