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Volumn 222, Issue , 1997, Pages 429-434
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Chemical treatment of glass substrates
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL MODIFICATION;
ELECTROMAGNETIC WAVE SCATTERING;
LEACHING;
RESISTORS;
SCANNING ELECTRON MICROSCOPY;
SILICA;
SUBSTRATES;
SURFACE CLEANING;
SURFACE ROUGHNESS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY PHOTOELECTRON SPECTROSCOPY;
X RAY SCATTERING;
GLASS;
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EID: 0031549978
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(97)00385-2 Document Type: Article |
Times cited : (11)
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References (9)
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