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Volumn 251, Issue , 1997, Pages 237-251

Defect interaction processes controlling the accumulation of defects produced by high energy recoils

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON MICROSCOPES; ELECTRONS; FISSION REACTIONS; FUSION REACTIONS; IRRADIATION; POINT DEFECTS; RANDOM PROCESSES;

EID: 0031549818     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(97)00278-X     Document Type: Article
Times cited : (72)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.