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Volumn 251, Issue , 1997, Pages 237-251
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Defect interaction processes controlling the accumulation of defects produced by high energy recoils
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
ELECTRON MICROSCOPES;
ELECTRONS;
FISSION REACTIONS;
FUSION REACTIONS;
IRRADIATION;
POINT DEFECTS;
RANDOM PROCESSES;
CASCADE DAMAGE;
DEFECT INTERACTION PROCESSES;
ELECTRON IRRADIATION;
HIGH ENERGY RECOILS;
SELF INTERSTITIAL ATOM (SIA) CLUSTERS;
RADIATION DAMAGE;
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EID: 0031549818
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3115(97)00278-X Document Type: Article |
Times cited : (72)
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References (35)
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