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Volumn 181, Issue 4, 1997, Pages 367-373
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Growth and characterization of Bi-doped PbS thin films prepared by hot-wall epitaxy
a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
BISMUTH;
CARRIER CONCENTRATION;
ELECTRIC CONDUCTIVITY OF SOLIDS;
EPITAXIAL GROWTH;
FILM GROWTH;
FILM PREPARATION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LIGHT ABSORPTION;
SEMICONDUCTING LEAD COMPOUNDS;
SEMICONDUCTOR DOPING;
X RAY DIFFRACTION ANALYSIS;
FULL WIDTH AT HALF MAXIMUM (FWHM);
HOT WALL EPITAXY;
THIN FILMS;
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EID: 0031549803
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(97)00301-1 Document Type: Article |
Times cited : (18)
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References (25)
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