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Volumn 175, Issue 3, 1997, Pages 237-248

Study of domain structure of thin magnetic films by polarised neutron reflectometry

Author keywords

Domains; Polarization analysis; Reflectometry; Thin films

Indexed keywords

FOURIER TRANSFORMS; MAGNETIC DOMAINS; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; NEUTRONS; POLARIZATION; REFLECTOMETERS; THIN FILMS;

EID: 0031549741     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(97)00247-3     Document Type: Article
Times cited : (12)

References (34)
  • 19
    • 0026989489 scopus 로고
    • Neutron optical devices and applications
    • Ch.F. Majkrzak, J.L. Wood (Eds.)
    • D.A. Korneev, L.P. Chernenko, Neutron Optical Devices and Applications, in: Ch.F. Majkrzak, J.L. Wood (Eds.), Proc. SPIE, vol. 1738, 1992, p. 468.
    • (1992) Proc. SPIE , vol.1738 , pp. 468
    • Korneev, D.A.1    Chernenko, L.P.2
  • 27
    • 30244556787 scopus 로고
    • Dissertation, LNPI
    • V.Ya. Kezerashvili, Dissertation, LNPI, 1986.
    • (1986)
    • Kezerashvili, V.Ya.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.