Optical measurements and modeling of an all solid state inorganic thin film electrochromic system

Journal of Non-Crystalline Solids

Volumn 218, Issue , 1997, Pages 296-301

  Macrelli, G ^a   Poli, E ^a   Demiryont, H ^a   Gotzelmann R ^b  

^a Isoclima SpA   (Italy)

^b EVONIK INDUSTRIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTROCHROMISM; ELECTROLYTES; INDIUM COMPOUNDS; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SPECTROPHOTOMETRY; THIN FILM DEVICES; TUNGSTEN COMPOUNDS; VANADIUM COMPOUNDS; VAPOR DEPOSITION;

ELECTROCHROMIC DEVICE; INDIUM TIN OXIDE; TUNGSTEN OXIDE; VANADIUM PENTOXIDE;

ELECTROOPTICAL DEVICES;

EID: 0031549378     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(97)00204-4     Document Type: Article

References (13)

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