Microbeam RBS on flat panel displays

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 543-550

  Schone H ^a   Walsh, D ^a   McGrath, R T ^a   Burkhart, J H ^a   Doyle, B L ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM; ION BEAMS; LEAD COMPOUNDS; MAGNESIA; PHOSPHORS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SURFACE STRUCTURE; THICKNESS MEASUREMENT;

FLAT PANEL DISPLAYS; MICROBEAM RUTHERFORD BACKSCATTERING SPECTROSCOPY;

PLASMA DISPLAY DEVICES;

EID: 0031549097     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00247-4     Document Type: Article

References (2)

1. T. Kojima, Recent Flat-Panel Display Developments in Japan, 1980 SID Im. Symp., San Diego (1980) p. 22.
2. RUMP, Computer Graphic Service, Ltd., Ithaca, NY.