Nuclear microscopy of single whole cultured cells: Beam damage studies

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 188-191

  Watt, Frank ^a   Thong, P S P ^a   Tan, A H M ^a   Tang, S M ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CELL CULTURE; ELECTROMAGNETIC WAVE EMISSION; HYDROGEN; ION BEAMS; ION BOMBARDMENT; MICROSCOPIC EXAMINATION; OXYGEN; PROTONS; RADIATION DAMAGE; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

PARTICLE INDUCED X RAY EMISSION (PIXE); SCANNING TRANSMISSION ION MICROSCOPY (STIM);

NUCLEAR INSTRUMENTATION;

EID: 0031549094     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00176-6     Document Type: Article

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