Proton probe quantitative trace elemental microscopy of kyanite bearing eclogytic samples

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 641-648

  Connell, S H ^a   Hart, R J ^a   Formenti, P ^a   Sellschop, J P F ^a   Wittenberg, A ^b  

^a UNIVERSITY OF THE WITWATERSRAND   (South Africa)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER SOFTWARE; ELECTROMAGNETIC WAVE EMISSION; NONDESTRUCTIVE EXAMINATION; PROTONS; RUBIDIUM; STRONTIUM; TRACE ELEMENTS; X RAY ANALYSIS; X RAY SPECTROSCOPY;

PROTON INDUCED X RAY EMISSION (PIXE) ANALYSIS; SOFTWARE PACKAGE GUPIX;

ROCKS;

EID: 0031549065     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00359-5     Document Type: Article

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