Ion beam studies of events typical of soft errors in semiconductor memories

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 507-512

  Aton, Tom ^a   Seitchik, Jerold ^a   Yang, Shyh Horng ^a   Shichijo, Hisashi ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; COSMIC RAYS; ERROR ANALYSIS; NEUTRONS; RANDOM ACCESS STORAGE; SEMICONDUCTOR STORAGE;

HEAVY ION STRIKES; ION MICROBEAMS;

ION BEAMS;

EID: 0031548930     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00241-3     Document Type: Article

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