Annihilation of positrons trapped at the (100) and (111) surfaces of Si

Applied Surface Science

Volumn 116, Issue , 1997, Pages 304-310

  Fazleev, N G ^a,b   Kuttler, K H ^a   Fry, J L ^a   Weiss, A H ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

^b KAZAN FEDERAL UNIVERSITY   (Russian Federation)

Author keywords

Annihilation; Auger; Positron; Semiconductor; Structure; Surface

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; MATHEMATICAL MODELS; SILICON; SURFACE PROPERTIES; VACUUM APPLICATIONS;

POSITRON ANNIHILATION; POSITRON SURFACE STATES;

CHARGED PARTICLES;

EID: 0031547889     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)01074-4     Document Type: Article

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