Background-free Auger line shape of Ag N 2,3 VV measured with positron annihilation induced Auger electron spectroscopy

Applied Surface Science

Volumn 116, Issue , 1997, Pages 318-323

  Jung, E ^a   Zhou, H Q ^a   Kim, J H ^a   Starnes, S ^a   Venkataraman, R ^a   Weiss, A H ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

Ag; Auger line shape; Low energy tail; N 2,3 VV transition; PAES; Surface

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARRIER CONCENTRATION; ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS;

POSITRON ANNIHILATION INDUCED AUGER ELECTRON SPECTROSCOPY (PAES);

SILVER;

EID: 0031547848     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)01076-8     Document Type: Article

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