Application of ion implantation to ceramic/metal joining

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 127-128, Issue , 1997, Pages 669-672

  Samandi, M ^a   Gudze, M ^a   Evans, P ^b  

^a UNIVERSITY OF WOLLONGONG   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC BONDING; GLANCING ANGLE X RAY DIFFRACTION (GAXRD);

ALUMINA; BONDING; BRAZING; COPPER; ELECTRIC CONDUCTIVITY OF SOLIDS; ION IMPLANTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TITANIUM; TITANIUM DIOXIDE; WETTING; X RAY DIFFRACTION ANALYSIS;

CERMETS;

EID: 0031547808     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)01152-4     Document Type: Article

References (8)

1. M.G. Nicholas, Joining of Ceramics, Chapman and Hall, London, 1990.
2. I.G. Brown, J.E. Galvin, B.F. Gavin and R.A. MacGill, Rev. Sci. Instrum. 57 (1986) 1069.
3. P.J. Evans, G.C. Watt and J.T. Noorman, Rev. Sci. Instrum. 65 (1994) 3082.
4. R. Cornelius, M. Samandi and P.J. Evans, Surf. Eng. 11 (1994) 123.
5. M. Samandi and M. Doroudian, Mat. Res. Soc. Proc. 347, Pittsburgh, 1994.
6. M. Gudze, Honours Thesis, Dept. Mats. Eng. Univ. Wollongong, 1995.
7. N. Inoue, Nucl. Inst. and Meth. in Phys. Res. B59/60 (1991) 1328.
8. J.S. Daniel et al., 1993 IEEE International Frequency Control Symposium, pp. 597-602, 1993.