The München scanning positron microscope

Applied Surface Science

Volumn 116, Issue , 1997, Pages 108-113

  Kogel G ^a   Triftshauser W ^a   Sperr, P ^a   Uhlmann, K ^a   Britton, D T ^a   Willutzki, P ^a   Steindl, R ^a   Junker, W ^a   Zecca, A ^a   Brusa, R S ^a   Duarte Naia, M P ^a   Karwasz, G P ^a   Paridaens, J ^a   Piazza, A ^a  

^a BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

Nondestructive testing; Positron microscope

Indexed keywords

DEFECTS; ELECTRON ENERGY LEVELS; HIGH ENERGY PHYSICS; NONDESTRUCTIVE EXAMINATION; PARTICLE BEAMS; RADIOISOTOPES;

POSITRON BEAMS; POSITRON EMISSIONS; POSITRON LIFETIMES; SCANNING POSITRON MICROSCOPES;

MICROSCOPES;

EID: 0031547782     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)01038-0     Document Type: Article

References (9)

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