An apparatus for high-resolution positron-annihilation induced auger-electron spectroscopy using a time-of-flight technique

Applied Surface Science

Volumn 116, Issue , 1997, Pages 177-180

  Ohdaira, Toshiyuki ^a   Suzuki, Ryoichi ^a   Mikado, Tomohisa ^a   Ohgaki, Hideaki ^a   Chiwaki, Mitsukuni ^a   Yamazaki, Tetsuo ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

Auger; Graphite; Positron; Surface; TOF

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; GRAPHITE;

POSITRON ANNIHILATION INDUCED AUGER ELECTRON SPECTROSCOPY (PAES); TIME OF FLIGHT (TOF) METHOD;

ELECTRON BEAMS;

EID: 0031547758     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)01049-5     Document Type: Article

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