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Journal of Crystal Growth

Volumn 174, Issue 1-4, 1997, Pages 845-850

Growth and characterization of bismuth and antimony thin films

(4) Martinez A a Collazo, R a Berrios A R a Ducoudray, G O a

a UNIVERSITY OF PUERTO RICO (Puerto Rico)

Author keywords

Antimony; Bismuth; Hot wall epitaxy; Thin films

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BISMUTH; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; FILM GROWTH; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING ANTIMONY; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON; SUBSTRATES; THERMAL EFFECTS; X RAY CRYSTALLOGRAPHY;

HOT WALL EPITAXY;

THIN FILMS;

EID: 0031547315 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(97)00042-0 Document Type: Article

Times cited : (6)

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