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Volumn 113-114, Issue , 1997, Pages 33-37

Van der Waals epitaxy of metal dihalide

Author keywords

CdI 2; In plane orientation relationship; Layered material (LM); PbI 2; Reflection high energy electron diffraction (RHEED); Van der Waals epitaxy (VDWE)

Indexed keywords

CRYSTAL LATTICES; IODINE COMPOUNDS; LATTICE CONSTANTS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SUBSTRATES; SURFACES; ULTRATHIN FILMS; VAN DER WAALS FORCES;

EID: 0031547306     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00770-2     Document Type: Article
Times cited : (19)

References (8)
  • 3
    • 0002784212 scopus 로고
    • and references therein
    • A. Koma, Thin Solid Films 216 (1992) 72, and references therein.
    • (1992) Thin Solid Films , vol.216 , pp. 72
    • Koma, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.