Characterization of structural defects in MLEK grown InP single crystals using synchrotron white beam X-ray topography

Journal of Crystal Growth

Volumn 174, Issue 1-4, 1997, Pages 230-237

  Chung, H ^a   Si, W ^a   Dudley, M ^a   Anselmo, A ^b   Bliss, D F ^b   Maniatty, A ^c   Zhang, H ^a   Prasad, V ^a  

^a Stony Brook University   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

Dislocations and slip bands; InP; Thermal stresses; Twins; X ray topography

Indexed keywords

CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); IRON; LATTICE CONSTANTS; MORPHOLOGY; PHASE INTERFACES; SEMICONDUCTOR DOPING; SINGLE CRYSTALS; STRAIN; STRESS CONCENTRATION; SULFUR; THERMAL STRESS;

SLIP BANDS; SYNCHROTRON WHITE BEAM X RAY TOPOGRAPHY;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0031547208     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)01110-4     Document Type: Article

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