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Volumn 113-114, Issue , 1997, Pages 371-376

Atomic force microscopy study of ZnSe/GaAs heteroepitaxy processes by metalorganic vapour phase epitaxy

Author keywords

AFM; GaAs; Heteroepitaxy; MOVPE; Stoichiometry; ZnSe

Indexed keywords

ARSENIC; ATOMIC FORCE MICROSCOPY; METALLORGANIC VAPOR PHASE EPITAXY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SURFACE CLEANING; SURFACES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION;

EID: 0031547185     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00833-1     Document Type: Article
Times cited : (5)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.