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Volumn 113-114, Issue , 1997, Pages 371-376
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Atomic force microscopy study of ZnSe/GaAs heteroepitaxy processes by metalorganic vapour phase epitaxy
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Author keywords
AFM; GaAs; Heteroepitaxy; MOVPE; Stoichiometry; ZnSe
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Indexed keywords
ARSENIC;
ATOMIC FORCE MICROSCOPY;
METALLORGANIC VAPOR PHASE EPITAXY;
OPTICAL PROPERTIES;
PHOTOLUMINESCENCE;
SEMICONDUCTING GALLIUM ARSENIDE;
SURFACE CLEANING;
SURFACES;
THERMAL EFFECTS;
THIN FILMS;
X RAY DIFFRACTION;
HETEROEPITAXY;
ZINC SELENIDE;
SEMICONDUCTING ZINC COMPOUNDS;
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EID: 0031547185
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(96)00833-1 Document Type: Article |
Times cited : (5)
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References (8)
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