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Volumn 172, Issue 1-2, 1997, Pages 53-57
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Selective area growth of GaP on Si by MOCVD
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Author keywords
[No Author keywords available]
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Indexed keywords
INTERFACES (MATERIALS);
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
RAMAN SPECTROSCOPY;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING SILICON;
SILICON NITRIDE;
SILICON WAFERS;
SINGLE CRYSTALS;
SUBSTRATES;
CRYSTAL PLANES;
FOCUSED RAMAN SPECTROSCOPY;
SELECTIVE AREA GROWTH;
SIDE WALLS;
CRYSTAL GROWTH;
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EID: 0031546758
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(96)00738-5 Document Type: Article |
Times cited : (13)
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References (7)
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