Atomic force microscopy of synthetic barite microcrystals

Journal of Crystal Growth

Volumn 172, Issue 1-2, 1997, Pages 231-248

  Archibald, Douglas D ^a,d   Gaber, Bruce Paul ^a   Hopwood, Jeremy D ^b   Mann, Stephen ^b   Boland, Thomas ^c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF BATH   (United Kingdom)

^c University of Washington   (United States)

^d RUSSELL RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; HYDROCHLORIC ACID; MORPHOLOGY; NUCLEATION; PHASE TRANSITIONS; REACTION KINETICS; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; SURFACE TENSION;

HOMOEPITAXIAL SECONDARY NUCLEATION; KINETIC BARRIERS; MICROSTEP FACES; SURFACE TEXTURE; SYNTHETIC BARITE;

BARITE;

EID: 0031546755     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00755-5     Document Type: Article

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