Pulse-width influence on laser structuring of dielectrics

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 122, Issue 3, 1997, Pages 359-363

  Ashkenasi, D ^a   Varel, H ^a   Rosenfeld, A ^a   Noack, F ^a   Campbell, E E B ^a  

^a MAX BORN INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFECTS; ELECTRON MICROSCOPY; ENERGY GAP; FLUORINE COMPOUNDS; LASER BEAM EFFECTS; LASER PULSES; MORPHOLOGY; SILICA;

CHIRPED PULSE AMPLIFICATION (CPA) TECHNIQUE; LASER FLUENCES;

DIELECTRIC MATERIALS;

EID: 0031546708     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)00563-0     Document Type: Article

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