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Volumn 33, Issue 1, 1997, Pages 100-101
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Measurement of heterojunction bipolar transistor thermal resistance based on a pulsed I-V system
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Author keywords
Heat transfer; Heterojunction bipolar transistors; Power bipolar transistors; Power transistors
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CURRENT MEASUREMENT;
ENERGY DISSIPATION;
HEAT RESISTANCE;
HEAT TRANSFER;
MATHEMATICAL MODELS;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
THERMAL CONDUCTIVITY;
VOLTAGE MEASUREMENT;
POWER BIPOLAR TRANSISTOR;
POWER TRANSISTOR;
PULSED CURRENT VOLTAGE MEASUREMENT;
HETEROJUNCTION BIPOLAR TRANSISTORS;
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EID: 0031546290
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19970059 Document Type: Article |
Times cited : (11)
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References (6)
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