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Volumn 121, Issue 1-4, 1997, Pages 299-301
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Behavior of radiation-induced defects and amorphization in silicon crystal
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
AMORPHIZATION;
CRYSTAL DEFECTS;
CRYSTALS;
ION BEAMS;
ION BOMBARDMENT;
RADIATION EFFECTS;
THERMAL EFFECTS;
RADIATION-INDUCED DEFECTS;
SILICON;
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EID: 0031546149
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(96)00392-8 Document Type: Article |
Times cited : (15)
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References (14)
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