Patent trend analysis: Incorporate current year data

World Patent Information

Volumn 19, Issue 4, 1997, Pages 243-249

  Bigwood, Michael P ^a  

^a International Technology Information   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031539307     PISSN: 01722190     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0172-2190(97)00031-8     Document Type: Article

References (7)

1. (1) Campbell, R. S. and Nieves, A. L. (1979) Battelle Pacific Northwest Laboratories Phase I Report, September.
2. (2) For a collection of papers discussing some of these issues, see Handbook of Quantitative Studies of Science and Technology, A. F. J. Van Raan, Ed. North Holland, Amsterdam, 1988.
3. (3) Bigwood, M. P. (1997) Analytic tools for the information-overload world, CHEMTECH, June, pp. 12-17.
4. (4) Campbell, R. S. (1982) Workshop on Patents and Innovation Statistics, OCDE, Paris.
5. (5) Mogee, M. E. (1991) Using patent data for technology analysis and planning. Research and Technology Management, July/ August, pp. 43-49.
6. (6) Bigwood, M. P. (1996) "Normalized" patent trend analysis: eliminating the impact of nonrelevant variables. Competitve Intelligence Review 7, 37-45.
7. (7) Mogee, M. E. and Kolar, R. G. (1996) International patent analysis as a tool for corporate technology analysis and planning. Technology Analysis Strategy Management 6, 485-503.