Method of monitoring the shape of an atomic force (tunneling) microscope tip using backscattering spectrometry

Technical Physics Letters

Volumn 23, Issue 6, 1997, Pages 452-453

  Dedkov, G V ^a   Rekhviashvili, S Sh ^a  

^a KABARDINO BALKARIAN STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031536827     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1261711     Document Type: Article

References (4)

1. V. S. Édel'man, Prib. Tekh. Éksp. No. 1, 24 (1991).
2. D. Sarid, Scanning Force Microscopy with Applications to Electric, Magnetic, and Atomic Forces (Oxford University Press, New York, 1991).
3. M. J. Vasile, D. A. Grigg, J. E. Griffith et al., Rev. Sci. Instrum. 62, 2167 (1991).
4. L. C. Hopkins, J. E. Griffith, L. R. Harriott et al., J. Vac. Sci. Technol. B 13, 335 (1995).