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Volumn 29, Issue 2, 1997, Pages 171-176
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Measuring and modelling thermal conductivity in thin films and microstructures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031536786
PISSN: 00181544
EISSN: None
Source Type: Journal
DOI: 10.1068/htec290 Document Type: Article |
Times cited : (7)
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References (21)
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