Measurement of the thermal properties of thin dielectric films by a probe technique with periodic heating. I. Theory underlying the method

Physics of the Solid State

Volumn 39, Issue 4, 1997, Pages 675-680

  Kravchun, S N ^a   Davitadze, S T ^a   Mizina, N S ^a   Strukov, B A ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031535247     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1129912     Document Type: Article

References (15)

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