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Volumn 203, Issue 1, 1997, Pages 43-52
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Investigation of radiation-induced defects in Cs2NaYF6
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031531163
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-3951(199709)203:1<43::AID-PSSB43>3.0.CO;2-F Document Type: Article |
Times cited : (12)
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References (16)
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