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Volumn 39, Issue 8, 1997, Pages 1197-1201
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Raman scattering spectra and electrical conductivity of thin silicon films with a mixed amorphous-nanocrystalline phase composition: Determination of the nanocrystalline volume fraction
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031523812
PISSN: 10637834
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1130042 Document Type: Article |
Times cited : (44)
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References (19)
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