Time-resolved X-ray powder diffraction using a large-area CCD-based detector and rietveld refinement: Solid-state polymerization of S2N2 to (SN)x

Journal of Synchrotron Radiation

Volumn 4, Issue 2, 1997, Pages 83-94

  Svensson, S O ^a   Birch, J ^a   Muller H ^a   Kvick, A ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Charge coupled device detectors; Powder diffraction; Rietveld refinement; S2N2; Time resolved studies; X ray area detectors

Indexed keywords

EID: 0031512254     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597000265     Document Type: Article

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