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Volumn 66, Issue 1, 1997, Pages 73-78

Measurement of the D(d, p)T Reaction in Ti for 2.5 < Ed < 6.5 ke V and Electron Screening in Metal

Author keywords

D(d, p)T reaction; Electron screening; Nuclear reactions in metal; Thick target yield

Indexed keywords


EID: 0031505463     PISSN: 00319015     EISSN: None     Source Type: Journal    
DOI: 10.1143/JPSJ.66.73     Document Type: Article
Times cited : (26)

References (22)
  • 2
    • 0001473784 scopus 로고
    • M. Fleischmann and S. Pons: J. Elec. Chem. 261 (1989) 301; S. E. Jones, E. P. Palmer, J. B. Czirr, P. L. Decker, G. L. Jensen, J. M. Thorne, S. F. Taylor and J. Rafelski: Nature 338 (1989) 737.
    • (1989) J. Elec. Chem. , vol.261 , pp. 301
    • Fleischmann, M.1    Pons, S.2
  • 7
    • 21144463394 scopus 로고
    • and references therein
    • S. Ichimaru: Rev. Mod. Phys. 65 (1993) 255, and references therein.
    • (1993) Rev. Mod. Phys. , vol.65 , pp. 255
    • Ichimaru, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.