Temperature dependence of the structures of solution-grown and melt-grown samples of n-hexatetracontane

Powder Diffraction

Volumn 12, Issue 1, 1997, Pages 49-52

  Fenrych, J ^a   Reynhardt, E C ^a   Basson, I ^a  

^a UNIVERSITY OF SOUTH AFRICA   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

RIETVELD REFINEMENT; X RAY POWDER DIFFRACTION;

CELL DIMENSIONS; GRADUAL TRANSITION; MONOCLINIC PHASE; ONSET TEMPERATURE; ORTHORHOMBIC STRUCTURES; POLYCRYSTALLINE SAMPLES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE;

TEMPERATURE DISTRIBUTION;

EID: 0031505363     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S088571560000943X     Document Type: Article

References (12)

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10. Sullivan, P. K., and Weeks, J. (1970). "The intensity as a function of temperature of the low-angle x-ray diffraction maxima of the n-paraffins: Hexatriacontane, tetratetracontane, and Tetranonacontane," J. Res. Natl. Bur. Stand. Sec. A 74, 203-214.
11. 162, synthesized with attention paid to high purity," Polym. J. 14, 441-456.
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