A New Approach to Quantitative X-Ray Microfluorescence Analysis of Individual Particles

X-Ray Spectrometry

Volumn 26, Issue 6, 1997, Pages 347-349

  Lankosz, Marek ^a   Pella, Peter A ^b  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; FLUORESCENCE; OPTICAL DATA PROCESSING; OPTICAL SYSTEMS; PARTICLE SIZE ANALYSIS;

CHARACTERISTIC LINES; CHEMICAL COMPOSITIONS; INDIVIDUAL PARTICLES; LINE INTENSITIES; MEASUREMENT OF PARTICLES; NEW APPROACHES; PARTICLE DIMENSIONS; PARTICLES SIZES; X-RAY BEAM; X-RAY MICROFLUORESCENCE;

PARTICLE SIZE;

EID: 0031501339     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4539(199711/12)26:6<347::aid-xrs232>3.0.co;2-y     Document Type: Article

References (5)

1. M. Lankosz, X-Ray Spectrom. 22, 125 (1993).
2. M. Lankosz, B. Holynska and P. A. Pella, X-Ray Spectrom. 22, 54 (1993).
3. M. Lankosz and P. A. Pella, X-Ray Spectrom. 24, 327 (1995).
4. Kevex XRF Toolbox Reference Manual. Fisons Instruments, Valencia, CA (1985).
5. X-RAY SPECTROMETRY, VOL. 26, 350-358 (1997)