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Volumn 31, Issue 1, 1997, Pages 215-218
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TEM characterization of InAs epilayers grown on InP substrates by metalorganic chemical-vapor deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031494210
PISSN: 03744884
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (11)
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