Role and characterization of surfaces in the aluminum industry

Journal De Physique. IV : JP

Volumn 7, Issue 6, 1997, Pages

  Dunlop, H M ^a   Benmalek, M ^a  

^a ALCAN INTERNATIONAL LIMITED   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SURFACE PHENOMENA; SURFACE PROPERTIES; SURFACE TREATMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE TECHNOLOGY;

ALUMINUM;

EID: 0031493475     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (99)