Nonparametric estimation for a general repair model

Annals of Statistics

Volumn 25, Issue 3, 1997, Pages 1140-1160

  Dorado, Crisanto ^a   Hollander, Myles ^b   Sethuraman, Jayaram ^b  

^a UNIVERSITY OF MISSOURI   (United States)

^b FLORIDA STATE UNIVERSITY   (United States)

Author keywords

Better than minimal repair; Confidence band; Counting process; Markov renewal process; Product integral; Supplemented life repair; Weak convergence

Indexed keywords

EID: 0031491526     PISSN: 00905364     EISSN: None     Source Type: Journal    
DOI: 10.1214/aos/1069362741     Document Type: Article

References (13)

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