|
Volumn 39, Issue 5, 1997, Pages 759-762
|
X-ray diffraction studies of silicon implanted with high-energy erbium ions
a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 0031489151
PISSN: 10637834
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1129963 Document Type: Article |
Times cited : (7)
|
References (17)
|