In-situ field effect measurements of copper phthalocyanine films doped with acceptor molecule

Journal of the Korean Physical Society

Volumn 31, Issue 3, 1997, Pages 522-524

  Sumimoto, Tsutomu ^a   Iizuka, Masaaki ^a   Kuniyoshi, Shigekazu ^a   Kudo, Kazuhiro ^a   Tanaka, Kuniaki ^a   Yu, Young Han ^b  

^a CHIBA UNIVERSITY   (Japan)

^b Department of Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031483486     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

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2. J. Tsukamoto, A. Takahashi and K. Kawasaki, Jpn, J. Appl. Phys. 29, 125 (1990).
3. K. Kudo, M. Yamashina and T. Moriizumi, Jpn. J. Appl. Phys. 23, 130 (1984).
4. T. Sumomoto, K. Kudo, T. Nagashima, S. Kuniyoshi and K. Tanaka, Synth. Metals 70, 1251 (1995).
5. S. M. Sze, Physics of Semiconductor Devices (Wiley, New york, 1969), p. 425.
6. A. Ahmad and R. A. Collins, Thin Solid Films 217, 75 (1992).