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Volumn 15, Issue 4, 1997, Pages 2029-2034

X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti films on graphite

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0031483463     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580675     Document Type: Article
Times cited : (18)

References (16)
  • 13
    • 0000503141 scopus 로고
    • edited by D. Briggs and M. P. Seah Wiley, Chichester, Chap. 5
    • M. P. Seah, in Practical Surface Analysis, edited by D. Briggs and M. P. Seah (Wiley, Chichester, 1990), Chap. 5, p. 245.
    • (1990) Practical Surface Analysis , pp. 245
    • Seah, M.P.1
  • 14
    • 4043113705 scopus 로고
    • Chemical Rubber, Boca Raton, FL, Chap. 6
    • T. L. Barr, Modern ESCA (Chemical Rubber, Boca Raton, FL, 1994), Chap. 6, Part VI.
    • (1994) Modern ESCA , Issue.6 PART
    • Barr, T.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.