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Volumn 15, Issue 4, 1997, Pages 2029-2034
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X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti films on graphite
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031483463
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.580675 Document Type: Article |
Times cited : (18)
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References (16)
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