Effect of electrostatic force and tapping mode operation of atomic force microscope

Journal of the Korean Physical Society

Volumn 31, Issue SUPPL. PART 1, 1997, Pages

  Hong, J W ^a   Kim, B I ^a   Kye, J I ^a   Khim, Z G ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031483373     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

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