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Volumn 15, Issue 4, 1997, Pages 1951-1954
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Low-temperature deposition of high-quality silicon dioxide films by sputtering-type electron cyclotron resonance plasma
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0031482158
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.580664 Document Type: Article |
Times cited : (21)
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References (10)
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