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Volumn 15, Issue 4, 1997, Pages 1951-1954

Low-temperature deposition of high-quality silicon dioxide films by sputtering-type electron cyclotron resonance plasma

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Indexed keywords


EID: 0031482158     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580664     Document Type: Article
Times cited : (21)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.