Determining the porosity of synthetic opals and porous silicon by x-ray methods

Physics of the Solid State

Volumn 39, Issue 5, 1997, Pages 856-858

  Ratnikov, V V ^a  

^a IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031480781     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1129984     Document Type: Article

References (10)

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